We are thrilled to share the memorable moments captured during our recent “Reverse Engineering and Metrology using Laser Scanning Data” seminar.

Hosted by QCONTROL, the event brought together esteemed participants from across the industry, fostering an enriching exchange of knowledge and insights.

We extend our heartfelt gratitude to our esteemed partners at Swiss Approval, whose gracious hospitality provided us with the perfect professional space and spectacular auditorium to host this event.

Our sincerest appreciation goes out to Davide Arzuffi from SHINING 3D for his insightful presentation, which expertly demonstrated the intricacies of Reverse Engineering procedures and showcased the unparalleled capabilities of QUICKSURFACE software.

Additionally, we are deeply grateful to Kai Gaertling from Verisurf for his invaluable support and presence at this event, as well as for providing us with the Master Gauge Portable Measuring Arm, which facilitated a comprehensive demonstration of CMM probing applications.

The resounding success of the seminar underscores our unwavering commitment to advancing Laser Scanning Metrology within the Greek market. As we eagerly prepare for our upcoming initiatives, we are invigorated by the boundless opportunities ahead and remain steadfast in our pursuit of innovation and excellence.

Stay tuned for further updates as we continue to spearhead advancements in Laser Scanning Metrology!